XPEEM and MFM Imaging of Ferroic Materials

The authors describe and compare two complementary techniques that are habitually used to image ferromagnetic ferroelectric materials with sub-micron spatial resolutions (typically 50 nm, at best 10 nm). first technique is variable-temperature photoemission electron microscopy magnetic/antiferromagnetic/polar contrast from circularly/linearly polarized incident X-rays (XPEEM). second magnetic force (MFM). Focusing mainly on the authors’ own work, but not exclusively, published/unpublished XPEEM MFM images of ferroic domains complex textures (involving vortices phase separation) presented. Highlights include use create 2D vector maps in-plane (IP) magnetization, imaging detect electrically driven local reversals magnetization. brief simple descriptions should be useful for beginners seeking employ these in order understand harness materials.